Closed-Loop dv/dt Control of SiC MOSFETs Yielding Minimal Losses and Machine Degradation

Laumen, Michael; Kragl, Robert; L├╝decke, Christoph; de Doncker, Rik W.

Piscataway, NJ : IEEE (2020)
Contribution to a book, Contribution to a conference proceedings

In: 2020 IEEE Transportation Electrification Conference & Expo (ITEC) / publisher: IEEE
Page(s)/Article-Nr.: 414-419

Identifier