Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

Polom, Timothy A. (Corresponding author); van der Broeck, Christoph Henrik (Corresponding author); de Doncker, Rik W. (Corresponding author); Lorenz, Robert D. (Corresponding author)

Piscataway, NJ : IEEE (2019)
Contribution to a book, Contribution to a conference proceedings

In: APEC 2019 : Thirty-Fourth Annual IEEE Applied Power Electronics Conference : March 17-21, 2019, Anaheim, California / the sponsors: Power Sources Manufacturers Association, IEEE Power Electronics Society, IEEE Industry Applications Society
Page(s)/Article-Nr.: 2720-2727