Semiconductor Temperature and Condition Monitoring Using Gate-Driver-Integrated Inverter Output Voltage Measurement

Schubert, Michael (Corresponding author); de Doncker, Rik W.

New York, NY : IEEE (2020)
Fachzeitschriftenartikel

In: IEEE transactions on industry applications
Band: 56
Heft: 3
Seite(n)/Artikel-Nr.: 2894-2902