Experimental Investigation on the Transient Switching Behavior of SiC MOSFETs Using a Stage-Wise Gate Driver
Engelmann, Georges (Corresponding author); Senoner, Tizian; de Doncker, Rik W.
New York, NY : IEEE (2018)
Fachzeitschriftenartikel
In: CPSS transactions on power electronics and applications
Band: 3
Heft: 1
Seite(n)/Artikel-Nr.: 77-87
Identifikationsnummern
- DOI: 10.24295/CPSSTPEA.2018.00008
- RWTH PUBLICATIONS: RWTH-2018-223920