Experimental analysis of the switching behavior of an IGBT using a three-stage gate driver

Engelmann, Georges; Lüdecke, Christoph; Bündgen, David; de Doncker, Rik W. (Corresponding author); Lu, Xi (Corresponding author); Xu, Zhuxian; Zou, Ke

Piscataway, NJ : IEEE (2017)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2017 IEEE 8th International Symposium on Power Electronics for Distributed Generation Systems (PEDG) : Florianópolis, Brazil, April 17th-20th, 2017
Seite(n)/Artikel-Nr.: 1-8